Research project

Compact imaging system for semiconductor inspection based on metalenses

Staff

Lead researchers

Dr Bruce (Jun-Yu) Ou

Associate Professor
Research interests
  • Metalens for imaging and metrology
  • AI for nanoimaging
  • Nano-optomechanics
Connect with Bruce (Jun-Yu)

Research outputs

Zhaoyang Wang, Ziyu Zhan, Anton Vetlugin, Bruce (Jun-Yu) Ou, Qiang Liu, Yijie Shen & Xing Fu, 2024, Light: Science & Applications, 13
Type: article
Yu Wang, Eng Aik Chan, Carolina Rendon-Barraza, Yijie Shen, Eric Plum & Bruce (Jun-Yu) Ou, 2024, Advanced Science, 11(38)
Type: article
Chuang Sun, Hailong Pi, Kian Shen Kiang, Jize Yan & Jun-Yu Ou, 2024, Advanced Optical Materials, 12(21)
Type: article