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Research project

Compact imaging system for semiconductor inspection based on metalenses

Lead researcher:

Dr Bruce (Jun-Yu) Ou
Research funder:

Royal Society
Status:

Active

Staff

Lead researcher

Doctor Bruce (Jun-Yu) Ou

Dr Bruce (Jun-Yu) Ou

Lecturer in Experimental Physics

Research interests

Metalens for imaging and metrology
AI for nanoimaging
Nano-optomechanics

Connect with Bruce (Jun-Yu)

Email: Bruce.Ou@soton.ac.uk

Research outputs

Near-infrared metalens empowered dual-mode high resolution and large FOV microscope

Chuang Sun, Hailong Pi, Kian Shen Kiang, Jize Yan & Jun-Yu Ou, 2024, Advanced Optical Materials

DOI: 10.1002/adom.202400512

Type: article

Tunable on-chip optical traps for levitating particles based on single-layer metasurface

Chuang Sun, Hailong Pi, Kian Shen Kiang, Tiberius S. Georgescu, Jun-Yu Ou, Hendrik Ulbricht & Jize Yan, 2024, Nanophotonics

DOI: 10.1515/nanoph-2023-0873

Type: article