Research project

Degradation mechanisms in semiconductor logic

Status:

Not active

Research outputs

Total Ionizing Dose, Random Dopant Fluctuations and its combined effect in the 45 nm PDSOI node

Eleni Chatzikyriakou, William Redman-White & Kees de Groot, 2017, Microelectronics Reliability, 68, 21-29

DOI: 10.1016/j.microrel.2016.11.007

Type: article

Three-dimensional Finite Elements method simulation of Total Ionizing Dose in 22 nm bulk nFinFETs

Eleni Chatzikyriakou, Kenneth Potter, William Redman-White & Kees de Groot, 2016, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, 1-5

DOI: 10.1016/j.nimb.2016.09.007

Type: article